Location: King’s Building K-2.69

The Zeiss Evo 15 is a user-friendly scanning electron microscope (SEM), offering standard high vacuum, variable pressure and environmental modes. It is equipped with standard secondary electron, backscatter, variable pressure secondary electron detectors.

The electron beam is produced by a LaB6 filament, offering high image brightness and contrast with resolution of up to 10nm. Images from multiple detectors can be taken simultaneously and combined to give new insights into sample morphology and composition. Variable pressure mode is available to look at non-conductive specimens with little or no sample preparation needed (i.e. uncoated samples). It can also be used for samples which are not compatible with high vacuum.

The EVO15 is equipped with an Oxford Instruments Ultim Max EDS detector, allowing for detailed high resolution elemental mapping of the SEM image in a matter of seconds.