The JEOL JSM 7800F Serial Block Face SEM is the same microscope as our top end JEOL JSM 7800F Prime Cryo-SEM and it is equipped with a katana microtome for volume electron microscopy.
- Accelerating voltage of 0.1 to 30 kV
- Resolution up to 0.8 nm
- Magnification of 25 to 1000000x
- Features a range of detectors including a lower and upper electron detector, and a backscattered electron detector
- Equipped with a katana microtome for volume electron microscopy
